论文信息 - Model-based test generation for software product line

Model-based test generation for software product line

Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.

Hongwei Zeng | Xinying Cai | Hong-wei Zeng | Xinying Cai

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