A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters

Analog-to-digital converters (ADCs) with different topologies respond differently to total ionizing dose (TID). A flexible behavioral modeling approach is proposed for system-level simulation of TID effects in successive-approximation-register (SAR) ADCs. The radiation-enabled approach can be adapted for a wide range of ADCs of various resolutions, clock speeds, and manufacturers. The empirical model is calibrated and validated, pre-rad and post-rad, for a particular ADC. Pre-rad calibration is performed by introducing distributions of static parameters corresponding to datasheet specifications. The post-rad calibration is accomplished by introducing error sources associated with the comparator and digital-to-analog converter (DAC), corresponding to experimental data. The calibrated model is used to examine the dynamic performance and to estimate the probability of parametric failure during the mission lifetime.

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