Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

This paper reports heavy ion and proton induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers a sampling of devices tested over the past eight years.

[1]  Leif Z. Scheick,et al.  TID, SEE and radiation induced failures in advanced flash memories , 2003, 2003 IEEE Radiation Effects Data Workshop.

[2]  T. Miyahira,et al.  Results of Single-Event Effects Measurements Conducted by the Jet Propulsion Laboratory , 2006, 2006 IEEE Radiation Effects Data Workshop.

[3]  C.K. Kouba,et al.  Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors , 2006, IEEE Transactions on Nuclear Science.

[4]  S.M. Guertin,et al.  Dynamic SDRAM SEFI detection and recovery test results , 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

[5]  D.N. Nguyen,et al.  Single Event Effect Characterization of High Density Commercial NAND and NOR Nonvolatile Flash Memories , 2007, IEEE Transactions on Nuclear Science.

[6]  Leif Z. Scheick.  SEE evaluation of digital analog converters for space applications , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[7]  J.S. Laird,et al.  Single-Event Transients in Voltage Regulators , 2006, IEEE Transactions on Nuclear Science.

[8]  T.F. Miyahira,et al.  Test results of single-event effects conducted by the Jet Propulsion Laboratory , 2005, IEEE Radiation Effects Data Workshop, 2005..

[9]  Farokh Irom,et al.  Single-event upset in commercial silicon-on-insulator PowerPC microprocessors , 2002 .

[10]  Stephen LaLumondiere,et al.  Catastrophic latchup in CMOS analog-to-digital converters , 2001 .

[11]  Farokh Irom,et al.  Single-event upset in the PowerPC750 microprocessor , 2001 .

[12]  Insoo Jun,et al.  Results of Recent 14 MeV Neutron Single Event Effects Measurements Conducted by the Jet Propulsion Laboratory , 2007, 2007 IEEE Radiation Effects Data Workshop.

[13]  G.M. Swift,et al.  Single Event Effects Test Results for Advanced Field Programmable Gate Arrays , 2006, 2006 IEEE Radiation Effects Data Workshop.

[14]  Farokh Irom,et al.  Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies , 2003 .

[15]  V. Pouget,et al.  Investigation of Single-Event Transients in Linear Voltage Regulators , 2008, IEEE Transactions on Nuclear Science.

[16]  Peter Thieberger,et al.  Heavy ion source development at Brookhaven National Laboratory’s Tandem van de Graaff facility , 2008 .

[17]  Gary Swift,et al.  VIRTEX-4 VQ static SEU Characterization Summary , 2008 .

[18]  S.M. Guertin,et al.  Radiation Tests on 2Gb NAND Flash Memories , 2006, 2006 IEEE Radiation Effects Data Workshop.

[19]  F. Irom,et al.  Results of Single-Event Transient Measurements Conducted by the Jet Propulsion Laboratory , 2008, 2008 IEEE Radiation Effects Data Workshop.

[20]  F. Irom,et al.  Catastrophic latchup in a CMOS operational amplifier , 2005, IEEE Transactions on Nuclear Science.