A study of residual strain in a K2O.6TiO2W/Al composite by using convergent beam electron diffraction

[1]  H. Maier,et al.  On the unique evaluation of local lattice parameters by convergent-beam electron diffraction , 1996 .

[2]  S. Rozeveld,et al.  Determination of multiple lattice parameters from convergent-beam electron diffraction patterns , 1993 .

[3]  H. Maier,et al.  Local lattice parameter measurements in a creep-deformed nickel-base superalloy by convergent beam electron diffraction , 1992 .

[4]  J. Zuo.  Automated lattice parameter measurement from HOLZ lines and their use for the measurement of oxygen content in YBa2Cu3O7-δ from nanometer-sized region , 1992 .

[5]  S. Schmauder,et al.  Measurement of residual strain in An AlSiCw composite using convergent-beam electron diffraction , 1992 .

[6]  G. Weatherly,et al.  On the electron diffraction contrast of coherently strained semiconductor layers , 1991 .

[7]  R. Arsenault,et al.  STRENGTHENING OF COMPOSITES DUE TO MICROSTRUCTURAL CHANGES IN THE MATRIX , 1991 .

[8]  William H. Press,et al.  Numerical recipes , 1990 .

[9]  A. Evans,et al.  The processing and mechanical behavior of an aluminum matrix composite reinforced with short fibers , 1990 .

[10]  Viggo Tvergaard,et al.  Analysis of tensile properties for a whisker-reinforced metal-matrix composite , 1990 .

[11]  Subra Suresh,et al.  Microstructural development in an aluminum alloy-SiC whisker composite , 1988 .

[12]  Michael Treacy,et al.  On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1-x.AsyP1-y epitaxial layers , 1985 .

[13]  P. Kelly,et al.  The determination of foil thickness by scanning transmission electron microscopy , 1975 .