Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set

A low-power test generation procedure that was developed earlier merges broadside test cubes that are derived from functional broadside tests in order to generate a low-power broadside test set. This has several advantages, most importantly, that test cubes, which are derived from functional broadside tests, create functional operation conditions in subcircuits around the sites of detected faults. These conditions are preserved when a test cube is merged with other test cubes. This brief applies a similar approach to the generation of a low-power skewed-load test set. The main challenge that this paper addresses is the derivation of skewed-load test cubes from functional broadside tests. The paper also considers the percentages of values that should be unspecified in the skewed-load test cubes in order to balance the need to create functional operation conditions with the need for test compaction.

[1]  Wu-Tung Cheng,et al.  Improved weight assignment for logic switching activity during at-speed test pattern generation , 2010, 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC).

[2]  Mark Mohammad Tehranipoor,et al.  Power-aware test generation with guaranteed launch safety for at-speed scan testing , 2011, 29th VLSI Test Symposium.

[3]  Irith Pomeranz.  Low-Power Test Generation by Merging of Functional Broadside Test Cubes , 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[4]  Irith Pomeranz,et al.  Static test compaction for delay fault test sets consisting of broadside and skewed-load tests , 2011, 29th VLSI Test Symposium.

[5]  Irith Pomeranz.  Low-power skewed-load tests based on functional broadside tests , 2014, TODE.

[6]  Atul K. Jain,et al.  Minimizing power consumption in scan testing: pattern generation and DFT techniques , 2004 .

[7]  V. Kamakoti,et al.  On Power-profiling and Pattern Generation for Power-safe Scan Tests , 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

[8]  Irith Pomeranz.  Augmenting Functional Broadside Tests for Transition Fault Coverage with Bounded Switching Activity , 2011, 2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing.

[9]  Shi-Yu Huang,et al.  QC-Fill: Quick-and-Cool X-Filling for Multicasting-Based Scan Test , 2009, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.