Comprehensive analysis of low-frequency noise variability components in bulk and fully depleted silicon-on-insulator metal–oxide–semiconductor field-effect transistor
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Tomohiro Yamashita | Keiichi Maekawa | Shiro Kamohara | Hideki Makiyama | Yoshiki Yamamoto | Shinobu Okanishi | Takumi Hasegawa | Kenichiro Sonoda | Yasuo Yamaguchi | Hiroki Shinkawata | K. Sonoda | Yoshiki Yamamoto | H. Makiyama | T. Yamashita | S. Kamohara | Y. Yamaguchi | T. Hasegawa | H. Shinkawata | K. Maekawa | S. Okanishi
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