KIMS—a knowledge-based computer vision system for production line inspection

Abstract the aim of this paper is to discuss a generic expert system prototyped for image analysis and interpretation tasks. The system christened KIMS is a knowledge-based image management system which oversees the entire process of image processing, segmentation, feature extraction, knowledge representation along with an expandable capability for image understanding task. We discuss the architecture of KIMS, its modeling environment, and demonstrate its usefulness with photo-to-image inspection as applied to a manufacturing line.

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