Defects, stoichiometry, and electronic transport in SrTiO3-δ epilayers: A high pressure oxygen sputter deposition study
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R. Deng | C. Leighton | G. Haugstad | K. Mkhoyan | J. Jeong | P. Xu | B. Jalan | P. Ambwani
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R. Deng | C. Leighton | G. Haugstad | K. Mkhoyan | J. Jeong | P. Xu | B. Jalan | P. Ambwani