New Method for Noise-Parameter Measurement of a Mismatched Linear Two-Port Using Noise Power Wave Formalism

The noise power wave formalism is used to extract the noise parameters from the noise power measurement. A first step consists of calibrating the measurement setup. We only assume that the receiver is unidirectional. The noise parameters are then deduced from power measurements with analytical relations with no further assumptions.

[1]  R. Hu,et al.  On-wafer noise-parameter measurement using wide-band frequency-variation method , 2005, IEEE Transactions on Microwave Theory and Techniques.

[2]  Lluís Pradell i Cara,et al.  Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources , 2002 .

[3]  L. Escotte,et al.  Evaluation of noise parameter extraction methods , 1993 .

[4]  J. Dangla,et al.  Accuracy improvements in two-port noise parameter extraction method , 1992, 1992 IEEE Microwave Symposium Digest MTT-S.

[5]  Dylan F. Williams,et al.  A General Waveguide Circuit Theory , 1992, Journal of research of the National Institute of Standards and Technology.

[6]  R. Q. Lane,et al.  The determination of device noise parameters , 1969 .

[7]  D. Pasquet,et al.  Determination of wave noise sources using spectral parametric modeling , 1997, 1997 IEEE MTT-S International Microwave Symposium Digest.

[8]  Vahe Adamian,et al.  Simplified Noise Evaluation of Microwave Receivers , 1984, IEEE Transactions on Instrumentation and Measurement.

[9]  M. Mitama,et al.  An Improved Computational Method for Noise Parameter Measurement , 1979 .

[10]  Daniel Pasquet,et al.  A new accurate calibration for a noise‐figure meter , 2005 .

[11]  G. Dambrine,et al.  Determination of Noise Parameters , 1990, Workshop on Measurement Techniques for Microwave Device Characterization and Modelling.

[12]  Frédéric Aniel,et al.  Four noise parameter determination method for transistors based on the frequency dependence of the noise figure , 1998 .

[13]  Daniel Pasquet,et al.  A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements , 2008, IEEE Transactions on Instrumentation and Measurement.

[14]  Daniel Pasquet,et al.  Time domain method for the noise parameters measurement , 2002, 2002 32nd European Microwave Conference.

[15]  David K. Walker,et al.  On-Wafer Measurement of Transistor Noise Parameters at NIST , 2007, IEEE Transactions on Instrumentation and Measurement.