A 10kfps 32×32 integrated test platform for electrical characterization of imagers

This paper presents an integrated test platform for imagers, which allows their electrical characterization by directly injecting the input current in each individual pixel. The core of the proposed ITP is a matrix of controllable current sources featuring low technology dependence, together with easily scalable row and column DACs for the digital programming of every single pixel current. A 10 kfps 32×32 4 bit×4 bit ITP chip is integrated in a low-cost 2.5 μm 1M CMOS technology, reporting μA-range full-scale and background programmability and FPN levels below 5%rms. As a result, the proposed ITP achieves accurate stimulation of both image patterns and motion sequences with a compact test setup.

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