Characterization of InAlAs/InGaAs APD arrays for SWIR imaging applications
暂无分享,去创建一个
Joe C. Campbell | Geoffrey S. Kinsey | Rengarajan Sudharsanan | Xiaoguang Zheng | Takahiro Isshiki | Andrey Masalykin | Joseph C. Boisvert | Moran Haddad
[1] K. Taguchi,et al. Monte Carlo simulation of impact ionization rates in InAlAs-InGaAs square and graded barrier superlattice , 1995 .
[2] D. Shaver,et al. InGaAsP/InP avalanche photodiodes for photon counting at 1.06 μm , 2002 .
[3] W. Walukiewicz,et al. Electron mobility and free‐carrier absorption in InP; determination of the compensation ratio , 1979 .
[4] R. Mcintyre. Multiplication noise in uniform avalanche diodes , 1966 .
[5] G. E. Stillman,et al. Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements , 1982 .