Performance of Dynamically Simulated Reference Patterns for Cross Correlation EBSD
暂无分享,去创建一个
M. Graef | D. Fullwood | E. Homer | Saransh Singh | Brian E. Jackson | Jordan Christensen | R. Wagoner
[1] M. Vaudin,et al. Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality , 2015 .
[2] G. Nolze,et al. Physics-based simulation models for EBSD: advances and challenges , 2015, 1505.07982.
[3] Daniela Roşca,et al. A new method of constructing a grid in the space of 3D rotations and its applications to texture analysis , 2014 .
[4] M. P. Stoykovich,et al. Specimen‐thickness effects on transmission Kikuchi patterns in the scanning electron microscope , 2014, Journal of microscopy.
[5] P N Quested,et al. Recent developments in two fundamental aspects of electron backscatter diffraction , 2014 .
[6] Jon Alkorta,et al. Limits of simulation based high resolution EBSD. , 2013, Ultramicroscopy.
[7] M. Graef,et al. Area-preserving projections from hexagonal and triangular domains to the sphere and applications to electron back-scatter diffraction pattern simulations , 2013 .
[8] A. Wilkinson,et al. High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. , 2012, Ultramicroscopy.
[9] John A. Basinger,et al. Precision of EBSD based Orientation Measurements , 2011, Microscopy and Microanalysis.
[10] A. Wilkinson,et al. Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. , 2010, Ultramicroscopy.
[11] John A. Basinger,et al. EBSD-based continuum dislocation microscopy , 2010 .
[12] A. Winkelmann. Principles of depth‐resolved Kikuchi pattern simulation for electron backscatter diffraction , 2010, Journal of microscopy.
[13] Roland Fortunier,et al. Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood. , 2010, Ultramicroscopy.
[14] D. Fullwood,et al. Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis". , 2010, Ultramicroscopy.
[15] A. Wilkinson,et al. Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction , 2010 .
[16] D. Fullwood,et al. Bragg's Law diffraction simulations for electron backscatter diffraction analysis. , 2009, Ultramicroscopy.
[17] R. Fortunier,et al. Accuracy assessment of elastic strain measurement by EBSD , 2009, Journal of microscopy.
[18] B. Adams,et al. High-Resolution Methods for Characterizing Mesoscale Dislocation Structures , 2008 .
[19] Carol Trager-Cowan,et al. Many-beam dynamical simulation of electron backscatter diffraction patterns. , 2007, Ultramicroscopy.
[20] A. Wilkinson,et al. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. , 2006, Ultramicroscopy.
[21] David C. Joy,et al. Monte Carlo Modeling for Electron Microscopy and Microanalysis , 1995 .
[22] Colin J. Humphreys,et al. The scattering of fast electrons by crystals , 1979 .
[23] S. Biggin,et al. A general method for locating the X‐ray source point in Kossel diffraction , 1977 .
[24] Robert F. Cook,et al. Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si. , 2015, Ultramicroscopy.
[25] R. Fortunier,et al. A method for accurate localisation of EBSD pattern centres. , 2011, Ultramicroscopy.
[26] A. Deal,et al. Energy-filtered electron backscatter diffraction. , 2008, Ultramicroscopy.
[27] M. Nowell,et al. HIGH-SPEED EBSD , 2008 .