NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

[1]  T. Scott,et al.  Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS] , 1999 .

[2]  Anthony M. Phan,et al.  Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report [STUB] , 2018 .

[3]  Kenneth A. LaBel,et al.  Recent radiation test results for trench power MOSFETs , 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

[4]  T. Scott,et al.  Application of a pulsed laser for evaluation and optimization of SEU-hard designs , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

[5]  Michael J. Campola,et al.  Single Event Effect Testing of the Micron MT46V128M8 , 2017 .

[6]  Kenneth A. LaBel,et al.  NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results , 2018, 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

[7]  Kenneth A. LaBel,et al.  Are Current SEE Test Procedures Adequate for Modern Devices and Electronics Technologies , 2008 .

[8]  E. J. Wyrwas Proton Irradiation of the 16GB Intel Optane SSD , 2017 .

[9]  V. Pouget,et al.  Pulsed-Laser Testing for Single-Event Effects Investigations , 2013, IEEE Transactions on Nuclear Science.

[10]  E. J. Wyrwas Proton Testing of nVidia GTX 1050 GPU , 2017 .

[11]  S. Buchner,et al.  Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies , 1994 .