Three-way flexible cantilever probes for static contact

In micro four-point probe measurements, three-way flexible L-shaped cantilever probes show significant advantages over conventional straight cantilever probes. The L-shaped cantilever allows static contact to the sample surface which reduces the frictional wear of the cantilever tips. We analyze the geometrical design space that must be fulfilled for the cantilevers to obtain static contact with the test sample. The design space relates the spring constant tensor of the cantilevers to the minimal value of the static tip-to-sample friction coefficient. Using an approximate model, we provide the analytical calculation of the compliance matrix of the L-shaped cantilever. Compared to results derived from finite element model simulations, the theoretical model provides a good qualitative analysis while deviations for the absolute values are seen. From a statistical analysis, the deviation is small for cantilevers with low effective spring constants, while the deviation is significant for large spring constants where the quasi one-dimensional approximation is no longer valid.

[1]  O. Sigmund,et al.  Rapid prototyping of nanotube-based devices using topology-optimized microgrippers , 2008, Nanotechnology.

[2]  R. Loo,et al.  Accurate Sheet Resistance Measurement on Ultra-Shallow Profiles , 2006 .

[3]  E. Rosseel,et al.  Comparative study of size dependent four-point probe sheet resistance measurement on laser annealed ultra-shallow junctions , 2008 .

[4]  R. Mullen,et al.  Mechanical properties of thick, surface micromachined polysilicon films , 1996, Proceedings of Ninth International Workshop on Micro Electromechanical Systems.

[5]  Songlin Feng,et al.  A MEMS probe card with 2D dense-arrayed 'hoe'-shaped metal tips , 2008 .

[6]  High precision micro-scale Hall effect characterization method using in-line micro four-point probes , 2008, 2008 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors.

[7]  J. Korvink,et al.  Adaptive moving mesh level set method for structure topology optimization , 2008 .

[8]  P. Bøggild,et al.  Static contact micro four-point probes with <11nm positioning repeatability , 2008 .

[9]  F. Smits Measurement of sheet resistivities with the four-point probe , 1958 .

[10]  Sune Thorsteinsson,et al.  Accurate microfour-point probe sheet resistance measurements on small samples. , 2009, The Review of scientific instruments.

[11]  Fei Wang,et al.  Accuracy of micro four-point probe measurements on inhomogeneous samples: A probe spacing dependence study , 2009, 2009 17th International Conference on Advanced Thermal Processing of Semiconductors.

[12]  Peter Bøggild,et al.  Sensitivity study of micro four-point probe measurements on small samples , 2010 .

[13]  Xinxin Li,et al.  MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing , 2009, Journal of Microelectromechanical Systems.

[14]  E. Rosseel,et al.  Review of electrical characterization of ultra-shallow junctions with micro four-point probes , 2010 .

[15]  Fei Wang,et al.  Micro-cantilevers for non-destructive characterization of nanograss uniformity , 2011, 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference.

[16]  D. H. Petersen,et al.  Micro-four-point Probe Hall effect Measurement method , 2008 .

[17]  L. B. Valdes,et al.  Resistivity Measurements on Germanium for Transistors , 1954, Proceedings of the IRE.

[18]  R. L. Edwards,et al.  Measurements of Young's modulus, Poisson's ratio, and tensile strength of polysilicon , 1997, Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots.

[19]  Anja Boisen,et al.  Scanning microscopic four-point conductivity probes , 2002 .