Dielectric Characterization by Microwave Cavity Perturbation Corrected for Nonuniform Fields
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Pavel Kabos | Jan Obrzut | James C. Booth | J. Alexander Liddle | David R. Novotny | Christian J. Long | Nathan D. Orloff | J. Booth | P. Kabos | J. Obrzut | T. Lam | C. Long | J. Liddle | D. Novotny | N. Orloff | Thomas Lam
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