论文信息 - The Impact of Self-Heating on Charge Trapping in High- $k$ -Metal-Gate nFETs - 字舞流文

The Impact of Self-Heating on Charge Trapping in High- $k$ -Metal-Gate nFETs

J. Woo | E. Cartier | J. C. Scott | C. Kothandaraman | F. Khan | S. Iyer | J. Campbell Scott | Jason C. S. Woo