Beam profile measurement at 30 GeV using optical transition radiation

We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 /spl mu/m rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized to extract electron beam angular divergences of /spl sim/100 /spl mu/rad.