Effect of parasitic capacitance and inductance on the dynamics and noise of dc superconducting quantum interference devices

Practical thin‐film dc superconducting quantum interference devices (SQUIDs) are often built with an integrated input coil which leads to the formation of various parasitic elements. We have designed and fabricated several square washer‐shaped dc SQUID test devices with various amounts of parasitic capacitance formed by covering the washer slits with superconducting coverplates of various widths. In the simplest approximation, the parasitic capacitance Cp appears entirely across the Josephson junctions; in a better approximation, Cp divides the total inductance into two parts, an effective SQUID loop inductance L and a small parasitic inductance Lp. For both models, noise‐free and noise‐rounded current‐voltage and voltage‐flux characteristics are calculated for various values of the ratios L/Lp and Cp/C, where C is the Josephson junction capacitance. The SQUID dynamics are significantly affected by Cp and Lp. The energy resolution e at first deteriorates with increasing Cp for Cp/C ≲ 2, but as Cp/C become...

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