The use of x-ray interferometry to investigate the linearity of the NPL Differential Plane Mirror Optical Interferometer
暂无分享,去创建一个
[1] P L Heydemann,et al. Determination and correction of quadrature fringe measurement errors in interferometers. , 1981, Applied optics.
[2] U. Bonse,et al. AN X‐RAY INTERFEROMETER , 1965 .
[3] Derek G. Chetwynd,et al. Sub-nanometre displacements calibration using X-ray interferometry , 1990 .
[4] A. Bergamin,et al. Quantized positioning of x-ray interferometers , 1997 .
[5] Gwo-Sheng Peng,et al. Correction of nonlinearity in one-frequency optical interferometry , 1996 .
[6] N Bobroff. Residual errors in laser interferometry from air turbulence and nonlinearity. , 1987, Applied optics.
[7] Basile,et al. Measurement of the silicon (220) lattice spacing. , 1994, Physical review letters.
[8] J. Nunn,et al. Verification of the sub-nanometric capability of an NPL differential plane mirror interferometer with a capacitance probe , 1998 .
[9] K. P. Birch,et al. Optical fringe subdivision with nanometric accuracy , 1990 .
[10] J. Lawall,et al. Heterodyne interferometer with subatomic periodic nonlinearity. , 1999, Applied optics.
[11] Chien‐Ming Wu,et al. Nonlinearity in measurements of length by optical interferometry , 1996 .
[12] J. Stümpel,et al. Combined optical and X–ray interferometry for high–precision dimensional metrology , 2000, Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences.
[13] K. P. Birch,et al. LETTER TO THE EDITOR: Correction to the Updated Edln Equation for the Refractive Index of Air , 1994 .