Nanomanipulation in a scanning electron microscope

Abstract An increasing variety of nano-scale products and devices in key application areas like nanoelectronics, nanotechnology and biotechnology demands novel tools for three-dimensional handling, assembly, characterisation and testing of fundamental building blocks like nanotubes and nanowires. In this paper, the state of the art in nanomanipulation systems based on a bottom-up technology for the manufacturing of nano-devices is reviewed, and a novel sensor-based manipulation and processing system for nano-scale objects which can be integrated in a scanning electron microscope (SEM) is presented. A series of tools for nanopositioning, nanomanipulation and microgripping devices has been developed. The control and vision system is based on a client–server approach to ensure positioning task execution and SEM image processing in real-time. The evaluation of the nanomanipulation system is shown by means of gripping of micro-sized powder particles, and by the attachment of carbon nanotubes on tips for atomic force microscopes. With future enhancements, which are currently under development, like a micro-tools exchanger, this system is expected to be a valuable tool for research laboratories and in industry for rapid prototyping in the nano-world.

[1]  Peter Bøggild,et al.  Towards pick-and-place assembly of nanostructures. , 2004, Journal of nanoscience and nanotechnology.

[2]  K. Eric Drexler,et al.  Nanosystems - molecular machinery, manufacturing, and computation , 1992 .

[3]  Seiji Akita,et al.  Nanoengineering of carbon nanotubes for nanotools , 2003 .

[4]  A. Bergander,et al.  High thrust Force Linear Actuators , 2004 .

[5]  László Forró,et al.  Field emission from single-wall carbon nanotube films , 1998 .

[6]  S. Johansson Hybrid Techniques in Microrobotics , 1993 .

[7]  Sumio Hosaka,et al.  Magnetic force microscope combined with a scanning electron microscope , 1993 .

[8]  Charles M. Lieber,et al.  DIRECT GROWTH OF SINGLE-WALLED CARBON NANOTUBE SCANNING PROBE MICROSCOPY TIPS , 1999 .

[9]  Yoshio Yamamoto,et al.  Tool development for force-feedback micro manipulation system , 2003, Proceedings 2003 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2003) (Cat. No.03CH37453).

[10]  Philippe Renaud,et al.  A 4-degrees-of-freedom microrobot with nanometer resolution , 1996, Robotica.

[11]  Shigeki Saito,et al.  Micro-object handling under SEM by vision-based automatic control , 1998, Other Conferences.

[12]  Fumihito Arai,et al.  Assembly of nanodevices with carbon nanotubes through nanorobotic manipulations , 2003, Proc. IEEE.

[13]  G. Binnig,et al.  SCANNING TUNNELING MICROSCOPY , 1983 .

[14]  Manfred Weck,et al.  Assembly of hybrid microsystems in a large-chamber scanning electron microscope by use of mechanical grippers , 1997, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

[15]  Ronald P. Andres,et al.  Fabrication of two‐dimensional arrays of nanometer‐size clusters with the atomic force microscope , 1995 .

[16]  Yann Lamy,et al.  Controlled Mounting of Individual Multiwalled Carbon Nanotubes on Support Tips , 2003 .

[17]  Mark J. Dyer,et al.  Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope , 1999 .

[18]  Aristides A. G. Requicha,et al.  Nanorobotic assembly of two-dimensional structures , 1998, Proceedings. 1998 IEEE International Conference on Robotics and Automation (Cat. No.98CH36146).

[19]  G. Binnig,et al.  Scanning tunneling microscopy , 1984 .

[20]  W. G. Matthews,et al.  Controlled manipulation of molecular samples with the nanoManipulator , 2000 .

[21]  D. Eigler,et al.  Positioning single atoms with a scanning tunnelling microscope , 1990, Nature.

[22]  P. Gasser,et al.  Defect-free AFM scratching at the Si/SiO2 interface used for selective electrodeposition of nanowires , 2004 .

[23]  Russell M. Taylor,et al.  Controlled placement of an individual carbon nanotube onto a microelectromechanical structure , 2002 .

[24]  Michel Troyon,et al.  A Scanning Force Microscope Combined with a Scanning Electron Microscope for Multidimensional Data Analysis , 1997 .

[25]  J. Bohr,et al.  A technique for positioning nanoparticles using an atomic force microscope , 1998 .

[26]  L. Samuelson,et al.  Controlled manipulation of nanoparticles with an atomic force microscope , 1995 .

[27]  H. Knapp,et al.  Controlled growth of carbon nanotubes on microstructured surfaces , 2004, 4th IEEE Conference on Nanotechnology, 2004..

[28]  Oliver Kraft,et al.  Mechanical Testing of Thin Films and Small Structures , 2001 .

[29]  Ludwig Josef Balk,et al.  A universal scanning-probe-microscope-based hybrid system , 2003 .

[30]  Tomomasa Sato,et al.  Hand-eye system in nano manipulation world , 1995, Proceedings of 1995 IEEE International Conference on Robotics and Automation.

[31]  H. Dai,et al.  Nanotubes as nanoprobes in scanning probe microscopy , 1996, Nature.

[32]  Seiji Akita,et al.  RAPID COMMUNICATION: Orientation and purification of carbon nanotubes using ac electrophoresis , 1998 .

[33]  Jean-Marc Breguet,et al.  High Precision Robotics System for Scanning Electron Microscopes , 2004 .

[34]  Paul K. Hansma,et al.  Carbon nanotubes as probes for atomic force microscopy , 2000 .

[35]  M. Tortonese,et al.  Atomic force microscope using piezoresistive cantilevers and combined with a scanning electron microscope , 1994 .

[36]  E. Garfunkel,et al.  A novel AFM/STM/SEM system , 1994 .

[37]  Daisuke Saya,et al.  Measurement of mechanical properties of three-dimensional nanometric objects by an atomic force microscope incorporated in a scanning electron microscope , 2002 .

[38]  Y. Hatamura,et al.  Direct coupling system between nanometer world and human world , 1990, IEEE Proceedings on Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots..