Observation of hot-carrier-induced nFET gate-oxide breakdown in dynamically stressed CMOS circuits
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R. Degraeve | B. Kaczer | C. Ciofi | G. Groeseneken | Ph. Roussel | F. Crupi | R. Degraeve | B. Kaczer | G. Groeseneken | F. Crupi | P. Roussel | C. Ciofi
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