Fast neutron-induced damage in INTEGRAL n-type HPGe detectors

Several INTEGRAL n-type HPGe detectors have been irradiated by fast neutrons and their degradation studied through the analysis of line shapes. The availability of three different fast neutron beams (5, 16 and 6-70 MeV) allowed a quantitative analysis of the importance of the neutron energy on the amount of damage. A comparison is made with the degradation induced by high-energy proton irradiations. Transient effects on the measured resolution are reported after high voltage cut-off on degraded detectors. (C) 1999 Elsevier Science B.V. All rights reserved.