Design of an X-mode fast-scanning reflectometry for edge density profile measurement on HT-7 tokamak

An amplitude modulation reflectometry system with fast-scanning microwave source is designed for edge density profile measurement on the HT-7 superconducting tokamak (R0=1.22 m, a=0.28 m, Bt: 1.8–2.3 T, plasma pulses of 1–20 s). The reflectometer launches microwave power from a very fast-scanning backward wave oscillator in 53–78 GHz to probe the plasma and receive the reflection by the density cutoff layer. It is an extraordinary mode reflectometer, which can measure the edge density profiles in normalized radius r/a from scrape-off layer up to 0.5 when Bt=2.2 T, Ne0=3×1019 m−3 in typical HT-7 operation parameters. The microwave amplitude modulation frequency is 200 MHz. A 2 MHz reference signal and the probing signal are obtained by mixing a 198 MHz local oscillator power with the demodulated microwave signals. Phase comparison is then accomplished at 2 MHz by I/Q phase detector. The scanning time over the full band of 53–78 GHz is about 0.5 ms. The reflectometry will fill in the space left by the five-...