Defining and Analysing the Optical Properties of Materials at the Nanoscale: A Collection of Thoughts, Opinions, Ideas and Data that Have Matured Over Years on Exploiting Ellipsometry for a Range of Characterisation Needs
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Tatiana Novikova | Herbert Wormeester | Maria Losurdo | Friedhelm Bechstedt | Giovanni Bruno | Eugene A. Irene | Kurt Hingerl | Josef Humlíček | Dave E. Aspnes | Peter Zeppenfeld | Christoph Cobet | Eugen Speiser | Carsten Rockstuhl | Christoph Menzel | Falk Lederer | Antonello De Martino | S. A. Little | R. W. Collins | Sylvain Marsillac | Manuel Cardona | Marcin L. Sadowski