Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study
暂无分享,去创建一个
[1] Kenneth M. Butler,et al. A case study of ir-drop in structured at-speed testing , 2003, International Test Conference, 2003. Proceedings. ITC 2003..
[2] C. Landrault,et al. Effectiveness of a variable sampling time strategy for delay fault diagnosis , 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.
[3] M. Ray Mercer,et al. Enhancing test efficiency for delay fault testing using multiple-clocked schemes , 2002, DAC '02.
[4] Kwang-Ting Cheng,et al. Path selection for delay testing of deep sub-micron devices using statistical performance sensitivity analysis , 2000, Proceedings 18th IEEE VLSI Test Symposium.
[5] Haihua Yan,et al. Experiments in detecting delay faults using multiple higher frequency clocks and results from neighboring die , 2003, International Test Conference, 2003. Proceedings. ITC 2003..