Investigation of Trap Levels in GaAs Schottky Diodes by Admittance Spectroscopy
暂无分享,去创建一个
[1] O. Wada,et al. Determination of deep electron traps in GaAs by time-resolved capacitance measurement , 1977 .
[2] M. Takikawa,et al. Electron and hole traps in N-GaAs crystals , 1976 .
[3] G. Vincent. Spectroscopie de pieges dans des diodes electroluminescentes GaAlAs , 1976 .
[4] G. Vincent,et al. Conductance and capacitance studies in GaP Schottky barriers , 1975 .
[5] K. Heime,et al. Deep-impurity-level spectroscopy at the GaAs epilayer/substrate interface, using a new constant-capacitance TSCAP method , 1975 .
[6] A. Mircea,et al. A study of electron traps in vapour-phase epitaxial GaAs , 1975 .
[7] D. Losee,et al. Admittance spectroscopy of impurity levels in Schottky barriers , 1975 .
[8] T. Ikoma,et al. Deep levels in gallium arsenide by capacitance methods , 1974 .
[9] A. G. Milnes,et al. Deep impurities in semiconductors , 1973 .
[10] J. Basinski,et al. Capacitance Measurements on Au–GaAs Schottky Barriers , 1968 .