论文信息 - The automated test system for parametric and functional control of the modern transceiver IC's

The automated test system for parametric and functional control of the modern transceiver IC's

The article describes the automated complex of parametric and functional control of the wide range of industrial transceivers IC's by using PXI family of National Instruments equipment. The capabilities of the designed system are observed as well as the software.

D. V. Boychenko | G. G. Davydov | A. S. Kolosova | L. N. Kessarinsky

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