Recombination-induced stacking fault degradation of 4H-SiC merged-PiN-Schottky diodes
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Anant K. Agarwal | Marko J. Tadjer | Karl D. Hobart | Robert E. Stahlbush | Qingchun Zhang | Eugene A. Imhoff | A. Agarwal | Qingchun Zhang | K. Hobart | R. Stahlbush | J. Caldwell | M. Tadjer | E. Imhoff | J. D. Caldwell
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