Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems

Reconfigurable systems are increasingly employed in many application fields, including aerospace. The long term exposure to radiation of space electronics can cause permanent faults, that may lead to the failure of the mission. In this paper we present a novel technique for on-line on-demand testing of permanent faults in the routing structure of SRAM-based FPGAs, that are employed in reconfigurable systems. The basic idea is to place testing circuits on the resources of the FPGA which are unused at the moment to test them before using those resources when a functional module of the reconfigurable system has to be placed. The proposed technique has been implemented and the achieved fault coverage has been assessed on a real-world reconfigurable system. This experiment demonstrated that all the faults in the routing resources under test can be detected.

[1]  Yervant Zorian,et al.  Minimizing the number of test configurations for different FPGA families , 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

[2]  J. J. Wang,et al.  Radiation effects in FPGAs , 2003 .

[3]  Martin Rozkovec,et al.  Application Dependent FPGA Testing Method , 2010, 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools.

[4]  Fabrizio Lombardi,et al.  Testing memory modules in SRAM-based configurable FPGAs , 1997, Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159).

[5]  Charles E. Stroud,et al.  BIST-based test and diagnosis of FPGA logic blocks , 2001, IEEE Trans. Very Large Scale Integr. Syst..

[6]  R.C. Baumann,et al.  Radiation-induced soft errors in advanced semiconductor technologies , 2005, IEEE Transactions on Device and Materials Reliability.

[7]  Andrea Domenici,et al.  GABES: A genetic algorithm based environment for SEU testing in SRAM-FPGAs , 2013, J. Syst. Archit..

[8]  Tian Xia,et al.  An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults , 2006, J. Electron. Test..

[9]  Mehdi Baradaran Tahoori Application-Dependent Testing of FPGAs , 2006, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[10]  Mario G. C. A. Cimino,et al.  Application of a Genetic Algorithm for Testing SEUs in SRAM-FPGA Systems , 2012, HiPEAC 2012.

[11]  Luca Sterpone,et al.  A Novel Fault Tolerant and Runtime Reconfigurable Platform for Satellite Payload Processing , 2013, IEEE Transactions on Computers.

[12]  Jörg Henkel,et al.  Transparent structural online test for reconfigurable systems , 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

[13]  Luca Sterpone,et al.  On-line testing of permanent radiation effects in reconfigurable systems , 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

[14]  Jian Xu,et al.  Novel technique for built-in self-test of FPGA interconnects , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

[15]  S Jamuna.,et al.  Detection and Diagnosis of Faults in the Routing Resources of a SRAM based FPGAs , 2012 .

[16]  Charles E. Stroud,et al.  Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[17]  Jia Yao,et al.  System-level Built-In Self-Test of global routing resources in Virtex-4 FPGAs , 2009, 2009 41st Southeastern Symposium on System Theory.

[18]  Philippe Roche,et al.  Technology downscaling worsening radiation effects in bulk: SOI to the rescue , 2013, 2013 IEEE International Electron Devices Meeting.

[19]  R.C. Ferguson,et al.  Use of field programmable gate array technology in future space avionics , 2005, 24th Digital Avionics Systems Conference.