Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
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Index of Keywords Preface On the book Achknowledgements Photo of the group List of Authors Part I - Fundamentals of Functional Materials: Functional Materials, P.M. Vilarinho Scaling of Silicon-Based Devices to Submicron Dimensions A.I. Kingon, Unsolved problems in ferroelectrics for scanning probe micrsocopy J.F. Scott, Part II - Fundamentals of Scanning Probe Techniques: Principles of Basic and Advanced Scanning Probe Microscopy D.A. Bonnell and R. Shao, Nanoscale probing of physical and chemical functionality with Near-Field Optical Microscopy L.M. Eng, Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy Y. Rosenwaks and R. Shikler, Expanding the Capabilities of the Scanning Tunneling Microscope K.F. Kelly et al, Functions of NC - AFM on atomic scale S. Morita et al, Part III - Application of Scanning Techniques to Functional Materials: Scanning probe microscopy of piezoelectric and transport phenomena in electroceramic materials S.V. Kalinin and D.A. Bonnell, SFM-BASED METHODS FOR FERROELECTRIC STUDIES A. Gruverman, Scanning Tunneling Spectroscopy: LOCAL DENSITY OF STATES AND SPIN DISTRIBUTION OF INTERACTING ELECTRON SYSTEMS M. Morgenstern,NANOINSPECTION OF DIELECTRIC AND POLARIZATION PROPERTIES AT INNER AND OUTER INTERFACES IN FUNCTIONAL FERROELECTRIC PZT THIN FILMS L.M. Eng, Microscale Contact Charging On A Silicon Oxide S. Morita et al, Constructive Nanolithography S.R. Cohen et al, Nanometer-Scale Electronics and Storage K.F. Kelly et al, Part IV - Contributed papers: STM tips fabrication for critical dimension measurement A. Pasquini et al, SCANNING PROBE MICROSCOPY CHARACTERIZATION OF FERROELECTRICS DOMAINS AND DOMAINS WALLS IN KTiOPO4 C. Canalias et al, Imaging local dielectric and mechanical responses with dynamic heterodyned electrostatic force microscopy D.R. Oliver et al, AFM PATTERNING OFSrTiO3 THIN FILMS AND DEVICE APPLICATIONS L. Pellegrino, Nanoscale investigation of a Rayleigh Wave on LiNbO3 J. Yang and R. Koch, Scanning Capacitance Force Microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2 G. Tallarida et al, Electrical characterisation of III-V buried heterostructure lasers by scanning capacitance microscopy O. Douheret, Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy L. Ozyuzer et al, Annealing influence on Co ultrathin film morphology in MBE grown Co/Au bilayers A. Wawro et al, Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration A.Rinkevich et al, SPM INVESTIGATION OF THIOLATED GOLD NANOPARTICLE PATTERNS DEPOSITED ON DIFFERENT SELF-ASSEMBLED SUBSTRATES F. Sbrana, AFM of guanine adsorbed on HOPG under electrochemical controL A. M. Chiorcea and A.M. Oliveira Brett, DYNAMICS IN MODEL MEMBRANES AND DNA-MEMBRANE COMPLEXES USING TEMPERATURE CONTROLLED ATOMIC FORCE MICROSCOPY Z.V. Leonenko and D.T. Cramb, INDEX