A Histogram-Based Testing Method for Estimating A/D Converter Performance

A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters are analyzed, and a single sine-wave histogram test can be performed to evaluate the ADC. With the appropriate approximations in the reference sine-wave histograms and the estimations of the ADC parameters, the realization of an ADC output analyzer circuit could be a simple task. An ADC output analyzer circuit is therefore developed and synthesized using a 0.18-mum technique to analyze the outputs of an 8-bit ADC and estimate its performances using the proposed method.

[1]  Y.H. Hu,et al.  CORDIC-based VLSI architectures for digital signal processing , 1992, IEEE Signal Processing Magazine.

[2]  D. Petri,et al.  Noise sensitivity of the ADC histogram test , 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).

[3]  J. Doernberg,et al.  Full-speed testing of A/D converters , 1984 .

[4]  Sungho Kang,et al.  Code-width testing-based compact ADC BIST circuit , 2004, IEEE Transactions on Circuits and Systems II: Express Briefs.

[5]  Jerome J. Blair.  Selecting test frequencies for sinewave tests of ADCs , 2005, IEEE Transactions on Instrumentation and Measurement.

[6]  Dario Petri,et al.  Noise sensitivity of the ADC histogram test , 1998, IEEE Trans. Instrum. Meas..

[7]  Florence Azaïs,et al.  Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST , 2001, J. Electron. Test..

[8]  Francisco André Corrêa Alegria,et al.  Variance of the cumulative histogram of ADCs due to frequency errors , 2003, IEEE Trans. Instrum. Meas..

[9]  Bin-Da Liu,et al.  Histogram Based Testing Strategy for ADC , 2006, 2006 15th Asian Test Symposium.

[10]  J. Schoukens.  A critical note on histogram testing of data acquisition channels , 1995 .

[11]  J. Blair.  Histogram measurement of ADC nonlinearities using sine waves , 1994 .

[12]  Tomás Lang,et al.  CORDIC-based computation of ArcCos and ArcSin , 1997, Proceedings IEEE International Conference on Application-Specific Systems, Architectures and Processors.

[13]  M. F. Wagdy,et al.  Determining ADC effective number of bits via histogram testing , 1991 .

[14]  Giovanni Chiorboli,et al.  ADC sinewave histogram testing with quasi-coherent sampling , 2001, IEEE Trans. Instrum. Meas..

[15]  Milos D. Ercegovac,et al.  Digital Arithmetic , 2003, Wiley Encyclopedia of Computer Science and Engineering.

[16]  Vishwani D. Agrawal,et al.  Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review] , 2000, IEEE Circuits and Devices Magazine.

[17]  Matthew Mahoney,et al.  DSP-Based Testing of Analog and Mixed-Signal Circuits , 1987 .

[18]  Dario Petri,et al.  Stochastic properties of quantization noise in memoryless converters affected by integral nonlinearity , 2004, IEEE Transactions on Instrumentation and Measurement.