Implementation of TRE systems into Emission Microscopes

Time-Resolved photon Emission (TRE) has the potential to identify faults by analysing the luminescence emission, as a function of time. TRE detectors provide time capabilities, but they have the disadvantage to be a single-point measurement, with no possibility to spatially map the luminescence emissions from the chip. In order to first localize the luminescence origin (e.g. a switching transistors or a faulty device within a chip), it is interesting to couple TRE equipments (i.e. time information) with light emission microscopes (i.e. spatial information). In this paper, we present a quantitative comparison of various commercially-available TRE detectors and photon counting electronic modules. From the analysis of the best solution, we propose a cost effective solution for the implementation of a TRE detector into a commercial emission microscope, with no hardware modifications.