论文信息 - Reliability Assessment of InAlN/GaN HFETs With Lifetime $8.9\times 10^{\mathrm {6}}$ h - 字舞流文

Reliability Assessment of InAlN/GaN HFETs With Lifetime $8.9\times 10^{\mathrm {6}}$ h

S. Cai | Y. Lv | Zhihong Feng | Xubo Song | X. Tan | Xingye Zhou | Yuangang Wang | G. Gu | Hongyu Guo | Hao Peng | Yulong Fang | J. Yin | L. Chi