SOI-based integrated circuits for high-temperature power electronics applications

The growing demand for hybrid electric vehicles (HEVs) has increased the need for high-temperature electronics that can operate at the extreme temperatures that exist under the hood. This paper presents a high-voltage, high-temperature SOI-based gate driver for SiC FET switches. The gate driver is designed and implemented on a 0.8-micron BCD on SOI process. This gate driver chip is intended to drive SiC power FETs for DC-DC converters and traction drives in HEVs. To this end, the gate driver IC has been successfully tested up to 200ºC. Successful operation of the circuit at this temperature with minimal or no heat sink, and without liquid cooling, will help to achieve higher power-to-volume as well as power-to-weight ratios for the power electronics modules in HEVs.

[1]  R. Jacob Baker,et al.  CMOS Circuit Design, Layout, and Simulation , 1997 .

[2]  Feng Quanyuan,et al.  An undervoltage lockout of hysteretic threshold of zero temperature coefficients , 2005, 2005 Asia-Pacific Microwave Conference Proceedings.

[3]  Wai-Kai Chen,et al.  The VLSI Handbook , 2000 .

[4]  J.W. Kolar,et al.  A simple, low cost gate drive method for practical use of SiC JFETs in SMPS , 2005, 2005 European Conference on Power Electronics and Applications.

[5]  Robert G. Meyer,et al.  Analysis and Design of Analog Integrated Circuits , 1993 .

[6]  D. Giannopoulos,et al.  A low loss high-frequency half-bridge driver with integrated power devices using EZ-HV SOI technology , 2002, APEC. Seventeenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.02CH37335).

[7]  Johann W. Kolar,et al.  A gate drive circuit for silicon carbide JFET , 2003, IECON'03. 29th Annual Conference of the IEEE Industrial Electronics Society (IEEE Cat. No.03CH37468).

[8]  F.Z. Peng,et al.  A smart gate drive with self-diagnosis for power MOSFETs and IGBTs , 2008, 2008 Twenty-Third Annual IEEE Applied Power Electronics Conference and Exposition.

[9]  L. Tolbert,et al.  SOI-Based Integrated Circuits for High-Temperature Applications , 2008 .

[10]  R. S. Chokhawala,et al.  A discussion on IGBT short-circuit behavior and fault protection schemes , 1995 .

[11]  J. Kolar,et al.  A SiC JFET driver for a 5 kW, 150 kHz three-phase PWM converter , 2005, Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005..

[12]  F. Shoucair Design Consideration in High Temperature Analog CMOS Integrated Circuits , 1986 .

[13]  Peter Jacobsen,et al.  High temperature automotive electronics , 2002 .

[14]  W. Pengchan,et al.  Study on temperature effect on p-n and zener junction for PTAT temperature sensor , 2008, 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology.

[15]  T.M. Jahns,et al.  A self-boost charge pump topology for a gate drive high-side power supply , 2003, IEEE Transactions on Power Electronics.

[16]  J.W. Kolar,et al.  A novel SiC J-FET gate drive circuit for sparse matrix converter applications , 2004, Nineteenth Annual IEEE Applied Power Electronics Conference and Exposition, 2004. APEC '04..

[17]  L. Tolbert,et al.  An SOI-based High-Voltage, High-Temperature Gate-Driver for SiC FET , 2007, 2007 IEEE Power Electronics Specialists Conference.

[18]  Tanvir Ahmad Abbasi,et al.  An improved fast transient response low dropout voltage regulator , 2009, 2009 IEEE International Symposium on Circuits and Systems.

[19]  L. Tolbert,et al.  A High-Temperature, High-Voltage SOI Gate Driver IC with High Output Current and On-Chip Low-Power Temperature Sensor , 2009 .

[20]  M. R. Hoque,et al.  A CMOS Under-voltage Lockout Circuit , .

[21]  Philip G. Neudeck,et al.  SiC Technology , 2000, The VLSI Handbook.