In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy
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Osvaldo N. Oliveira | M. Manuela M. Raposo | Roberto Mendonça Faria | R. Lobo | M. Pereira-da-Silva | R. Faria | O. N. Oliveira | M. Raposo | R F M Lobo | M A Pereira-da-Silva
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