Method for testing memory module and hub of memory module for the same

Receiving a bank access sequence input from the outside, it is applied to it to generate a test pattern sequence, and thus the test on the memory module how to perform the BIST to the memory module and the hub of the memory module for this purpose is disclosed. And to store, as the bank address of the bank access order from the outside in order, as desired bank access procedure may be carried out a test on the memory module. Therefore, it is possible to effectively detect the failure of the memory module.