White X‐ray microdiffraction analysis of defects, strain and tilts in a free standing GaN film
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S. Nakamura | G. Ice | R. Barabash | W. Liu | B. Haskell | J. Speck
[1] R. F. Davis,et al. Characterization of growth defects in thin GaN layers with X‐ray microbeam , 2007 .
[2] G. Ice,et al. Chapter 79 White Beam Microdiffraction and Dislocations Gradients , 2007 .
[3] J. Budai,et al. Spatially resolved distribution of dislocations and crystallographic tilts in GaN layers grown on Si(111) substrates by maskless cantilever epitaxy , 2006 .
[4] S. Denbaars,et al. Mapping misorientation and crystallographic tilt in GaN layers via polychromatic microdiffraction , 2006 .
[5] S. Denbaars,et al. Microstructure and enhanced morphology of planar nonpolar m-plane GaN grown by hydride vapor phase epitaxy , 2005 .
[6] James S. Speck,et al. Nonpolar InGaN∕GaN emitters on reduced-defect lateral epitaxially overgrown a-plane GaN with drive-current-independent electroluminescence emission peak , 2004 .
[7] James S. Speck,et al. Defect reduction in (112̄0) a-plane gallium nitride via lateral epitaxial overgrowth by hydride vapor-phase epitaxy , 2003 .
[8] S. Denbaars,et al. Characterization of a-Plane GaN/(Al,Ga)N Multiple Quantum Wells Grown via Metalorganic Chemical Vapor Deposition , 2003 .
[9] J. Speck,et al. Modeling the extended defect evolution in lateral epitaxial overgrowth of GaN: Subgrain stability , 2003 .
[10] S. Denbaars,et al. Control of crystallographic tilt in GaN grown on Si (111) by cantilever epitaxy , 2002 .
[11] Wenge Yang,et al. Three-dimensional X-ray structural microscopy with submicrometre resolution , 2002, Nature.
[12] S. Denbaars,et al. Observation of crystallographic wing tilt in cantilever epitaxy of GaN on silicon carbide and silicon (111) substrates , 2001 .
[13] S. Denbaars,et al. In situ, real-time measurement of wing tilt during lateral epitaxial overgrowth of GaN , 2000 .
[14] Oliver Ambacher,et al. Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry , 1998 .