PSP based DCG-FGT transistor Model: Full characterization procedure

Full characterization of a new DCG-FGT (Dual-Control-Gate Floating-Gate Transistor) transistor model for static and transient simulations is presented. The model is running under electrical simulator (ELDO) and is characterized thanks to ICCAP software. It has been validated on an advanced STMicroelectronics technology. The final objective of this work is to provide an accurate and scalable model available in design framework.

[1]  T. Skotnicki,et al.  The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance , 2005, IEEE Circuits and Devices Magazine.

[2]  Wenceslas Rahajandraibe,et al.  PSP based DCG-FGT transistor model including characterization procedure , 2011, 2011 18th IEEE International Conference on Electronics, Circuits, and Systems.

[3]  R. Bouchakour,et al.  A new floating gate compact model applied to flash memory cell , 2003 .

[4]  M. Weissman.  1/f noise and other slow, nonexponential kinetics in condensed matter. , 1988 .

[5]  Y. Tsividis.  Operation and modeling of the MOS transistor , 1987 .

[6]  Jean Michel Portal,et al.  MM11 based flash memory cell model including characterization procedure , 2006, 2006 IEEE International Symposium on Circuits and Systems.

[7]  H. Williams,et al.  Analytical and experimental studies of thermal noise in MOSFET's , 1994 .

[8]  C. Tretz,et al.  High-Density Reduced-Stack Logic Circuit Techniques Using Independent-Gate Controlled Double-Gate Devices , 2006, IEEE Transactions on Electron Devices.

[9]  G. Gildenblat,et al.  PSP: An Advanced Surface-Potential-Based MOSFET Model for Circuit Simulation , 2006, IEEE Transactions on Electron Devices.

[10]  L.K.J. Vandamme,et al.  1/f noise in MOS devices, mobility or number fluctuations? , 1994 .

[11]  Jaime Ramirez-Angulo,et al.  Low-voltage circuits building blocks using multiple-input floating-gate transistors , 1995 .

[12]  R. Bouchakour,et al.  Dual-control-gate floating gate transistor: A building block for circuit design , 2011 .

[13]  Lode K. J. Vandamme,et al.  Noise as a diagnostic tool for quality and reliability of electronic devices , 1994 .