论文信息 - Scattering From Surface RoughnessÃ¢â‚¬â€?Implications On X-Ray Imaging

Scattering From Surface RoughnessÃ¢â‚¬â€?Implications On X-Ray Imaging

Results of an analysis of surface profile measurements by J. Bennett on a set of very smooth flat surfaces is presented. Visible scattering profiles are predicted and compared with measured scatter profiles. The predicted scatter profiles are integrated for compari-son with total integrated scatter measurements (TIS). Using the model analysis at X-ray wavelengths illustrates the impact of various surface profiles on X-ray imaging.

R J. Noll | P Glenn

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