SIMPLY: Design of a RRAM-Based Smart Logic-in-Memory Architecture using RRAM Compact Model

In this work, we introduce a new RRAM-based Smart IMPLY (SIMPLY) logic scheme with unique benefits for low-power systems and verify its feasibility and advantages by means of circuit simulations allowing appropriate device/circuit requirements co-design. Differently from previous works, we use a physics-based compact model of RRAM devices able to reproduce both the ultrafast AC and the DC behavior, accounting for the intrinsic variability of the resistive states, the occurrence of Random Telegraph Noise, and the logic state degradation. The proposed scheme strongly alleviates the issue of logic state degradation, breaks the trade-off between the choice of VSET and VCOND, and allows saving energy up to a factor of ~230 requiring minimum area overhead.

[1]  Paolo Pavan,et al.  Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model , 2018, 2018 48th European Solid-State Device Research Conference (ESSDERC).

[2]  Pugach Nataliya,et al.  International roadmap for devices and systems. Cryogenic electronics and quantum information processing. 2018 Update , 2019 .

[3]  Earl E. Swartzlander,et al.  Memcomputing (Memristor + Computing) in Intrinsic SiOx-Based Resistive Switching Memory: Arithmetic Operations for Logic Applications , 2017, IEEE Transactions on Electron Devices.

[4]  Yi Li,et al.  Reprogrammable logic in memristive crossbar for in-memory computing , 2017 .

[5]  J. Poikonen,et al.  Erratum for Two memristors suffice to compute all Boolean functions , 2010 .

[6]  Uri C. Weiser,et al.  Memristor-Based Material Implication (IMPLY) Logic: Design Principles and Methodologies , 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[7]  Gregory S. Snider,et al.  ‘Memristive’ switches enable ‘stateful’ logic operations via material implication , 2010, Nature.

[8]  L. Larcher,et al.  Multiscale modeling of defect-related phenomena in high-k based logic and memory devices , 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[9]  Qiao Chen,et al.  A Logic Circuit Design for Perfecting Memristor-Based Material Implication , 2017, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[10]  Luca Larcher,et al.  Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design , 2018, IEEE Transactions on Electron Devices.