RADFET: A review of the use of metal-oxide-silicon devices as integrating dosimeters

Abstract Calibrated, radiation-sensitive metal-oxide-silicon field-effect transistors (RADFETs) have been launched into space and used in the laboratory to measure the doses from a variety of radiation sources. These experiments have demonstrated that the RADFET provides a convenient method for the continuous monitoring of total dose. The electrical output consists of a d.c. voltage which can be converted electronically to a value for accumulated dose. The voltage can be read remotely and displayed continuously. This review briefly outlines the physical mechanisms by which radiation dose is registered by RADFETs, describes the characteristics and performance of a practical RADFET and discusses applications. In addition to the name “RADFET”, these devices have been called “MOS Dosimeters”, “Mosimeters” and “Space Charge (SC) Transducers”.

[1]  Andrew Holmes-Siedle,et al.  A Simple Model for Predicting Radiation Effects in MOS Devices , 1978, IEEE Transactions on Nuclear Science.

[2]  F. J. Grunthaner,et al.  Radiation-Induced Defects in SiO2 as Determined with XPS , 1982, IEEE Transactions on Nuclear Science.

[3]  J. M. Battaglia,et al.  Damage Calculations for Devices in the Diagnostic Penetrations of a Fusion Reactor , 1984, IEEE Transactions on Nuclear Science.

[4]  L. August,et al.  Advantages of Using a PMOS FET Dosimeter in High-Dose Radiation Effects Testing , 1984, IEEE Transactions on Nuclear Science.

[5]  T. R. Oldham,et al.  Proton and Heavy-Ion Radiation Damage Studies in MOS Transistors , 1985, IEEE Transactions on Nuclear Science.

[6]  Andrew Holmes-Siedle,et al.  The space-charge dosimeter: General principles of a new method of radiation detection , 1974 .

[7]  F. B. McLean A Framework for Understanding Radiation-Induced Interface States in SiO2 MOS Structures , 1980, IEEE Transactions on Nuclear Science.

[8]  A. Holmes-Siedle,et al.  Linearity of pMOS radiation dosimeters operated at zero bias , 1985 .

[9]  J. R. Schwank,et al.  An IC Compatible Ionizing Radiation Detector , 1981, IEEE Transactions on Nuclear Science.

[10]  A. Holmes-Siedle,et al.  The Mechanisms of Small Instabilities in Irradiated MOS Transistors , 1983, IEEE Transactions on Nuclear Science.

[11]  L. August Design Criteria for a High-Dose MOS Dosimeter for Use in Space , 1984, IEEE Transactions on Nuclear Science.

[12]  E. Stassinopoulos,et al.  The Damage Equivalence of Electrons, Protons, and Gamma Rays in MOS Devices , 1982, IEEE Transactions on Nuclear Science.

[13]  Anant G. Sabnis,et al.  Process Dependent Build-Up of Interface States in Irradiated N-Channel MOSFETs , 1985, IEEE Transactions on Nuclear Science.

[14]  A Review of Dose Rate Dependent Effects of Total Ionizing Dose (TID) Irradiations , 1980, IEEE Transactions on Nuclear Science.

[15]  A. Holmes-Siedle,et al.  The Physics of Failure of MIS Devices Under Radiation , 1968 .

[16]  R. C. Hughes Theory of response of radiation sensing field effect transistors , 1985 .

[17]  L. August Estimating and Reducing Errors in MOS Dosimeters Caused by Exposure to Different Radiations , 1982, IEEE Transactions on Nuclear Science.

[18]  Leonard Adams,et al.  The Development of an MOS Dosimetry Unit for Use in Space , 1978, IEEE Transactions on Nuclear Science.

[19]  Dose Enhancement Effects in MOSFET IC's Exposed in Typical 60Co Facilities , 1983, IEEE Transactions on Nuclear Science.

[20]  A. Holmes-Siedle,et al.  Calibration and Flight Testing of a Low-Field pMOS Dosimeter , 1985, IEEE Transactions on Nuclear Science.

[21]  A. Holmes-Siedle,et al.  Dosimetric Silica Films: The Influence of Fields on the Capture of Positive Charge , 1982, IEEE Transactions on Nuclear Science.

[22]  J. R. Srour Radiation effects on and dose enhancement of electronic materials , 1984 .

[23]  P. S. Winokur,et al.  Interface-State Generation in Radiation-Hard Oxides , 1980, IEEE Transactions on Nuclear Science.