Rule induction for identifying multi layer tool commonalities

A methodology based on association rule concepts is given for detecting fab tool commonality of affected lots. The performance of the methodology is then compared to several traditional methods such as ANOVA and contingency tables using eight actual production cases. In each case, the offending tool is affecting lots at multiple process layers.

[1]  E. Tuv,et al.  Spatial Patterns in Sort Wafer Maps and Identifying Fab Tool Commonalities , 2008, 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

[2]  G. Y. Kong Tool commonality analysis for yield enhancement , 2002, 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259).

[3]  Trevor Hastie,et al.  The Elements of Statistical Learning , 2001 .

[4]  L. K. Garling,et al.  Determining equipment performance using analysis of variance , 1990, IEEE/SEMI International Symposium on Semiconductor Manufacturing Science.