论文信息 - Validation of 64Cu-ATSM damaging DNA via high-LET Auger electron emission - 字舞流文

Validation of 64Cu-ATSM damaging DNA via high-LET Auger electron emission

Y. Fujibayashi | Takamitsu A Kato | A. Fujimori | H. Kitamura | S. Kraft | T. Furukawa | J. Maeda | J. Bell | Dayton D. McMillan | Yukie Yoshii | K. A. Mann | M. Genet | Garrett Phoonswadi | Junko Maeda