Fast Transformation for DAC Parameters Identification

Modeling of digital-to-analog converters (DACs) and identification of their critical parameters are dealt with. The attention is focused on a well-known static model accounting for linearity and intermodulation errors, which are of major concern for DAC functional characterization as well as troubleshooting. The parameters for this model are currently estimated through linear transformations, the application of which is not practical for high-resolution DACs. Practical relations for assessing the uncertainty on estimated parameters are also not available. The authors introduce a new parameter in the model with the aim of proposing an alternative formulation. Complete identification of the DAC under test can thus be pursued through a new fast transformation, characterized by reduced computational burden and suitable for fully in-place implementation

[1]  D. M. Hummels,et al.  Dynamic compensation of digital to analog converters , 1999, IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309).

[2]  J. Schoukens,et al.  Using reduced-order models in D/A converter testing , 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).

[3]  S. Standard.  GUIDE TO THE EXPRESSION OF UNCERTAINTY IN MEASUREMENT , 2006 .

[4]  Eduard Alarcón,et al.  Mismatch and dynamic modeling of current sources in current-steering CMOS D/A converters: an extended design procedure , 2004, IEEE Transactions on Circuits and Systems I: Regular Papers.

[5]  T. R. Viswanathan,et al.  Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends , 1997 .

[6]  Sergio Rapuano,et al.  Digital to Analog converters: a metrological overview , 2004 .

[7]  J. Schoukens,et al.  Static nonlinearity testing of D/A converters , 2001, IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188).

[8]  L. Debnath,et al.  Walsh Functions and Their Applications , 1979, IEEE Transactions on Systems, Man, and Cybernetics.

[9]  Patrick P Fasang.  Optimal selection of test vectors for DA converter testing , 2002 .

[10]  Mohamad Sawan,et al.  On chip testing data converters using static parameters , 1998, IEEE Trans. Very Large Scale Integr. Syst..

[11]  J. Schoukens,et al.  Modelling of partially-segmented d/a converters , 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

[12]  Paolo Crippa,et al.  A statistical methodology for the design of high-performance CMOScurrent-steering digital-to-analog converters , 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..