Ultrahigh-Vacuum Third-Order Spherical Aberration (Cs) Corrector for a Scanning Transmission Electron Microscope
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K. Furuya | K. Mitsuishi | T. Sannomiya | M. Takeguchi | Y. Kondo | F. Hosokawa | M. Kawazoe | K. Okamoto | M. Hori | T. Iwama | Kimiharu Okamoto