New Techniques and Tools for Application-Dependent Testing of FPGA-Based Components

Field programmable gate array (FPGA) devices are increasingly being deployed in industrial environments, making reconfigurable hardware testing and reliability an active area of investigation. While FPGA devices can be tested exhaustively, the so-called application-dependent test (ADT) has emerged as an effective approach ensuring reduced testing efforts and improving the manufacturing yield since it can selectively exclude a subset of faults not affecting a given design. In addition to manufacturing, ADT can be used online, providing a solution for fast runtime fault detection and diagnostics. This paper identifies a number of issues in existing ADT techniques which limit their applicability and proposes new approaches improving the range of covered faults, with special emphasis on feedback bridging faults, as well as new algorithms for generating ADT test configurations. Furthermore, the work introduces a software environment addressing the current lack of tools, either academic or commercial, supporting ADT techniques. The architecture of the environment is highly modular and extensively based on a plug-in approach. To demonstrate the potential of the toolset, we developed a complete suite of plug-ins, based on both state-of-the-art ADT techniques and the novel approaches introduced here. The experimental results presented at the end of the paper confirm the impact of the proposed techniques.

[1]  S. Yang,et al.  Logic Synthesis and Optimization Benchmarks User Guide Version 3.0 , 1991 .

[2]  P. R. Stephan,et al.  SIS : A System for Sequential Circuit Synthesis , 1992 .

[3]  Charles E. Stroud,et al.  Built-in self-test of FPGA interconnect , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[4]  R. Bell,et al.  IEC 61508: functional safety of electrical/electronic/ programme electronic safety-related systems: overview , 1999 .

[5]  Nur A. Touba,et al.  A low cost approach for detecting, locating, and avoiding interconnect faults in FPGA-based reconfigurable systems , 1999, Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013).

[6]  Hideo Ito,et al.  Testing the logic cells and interconnect resources for FPGAs , 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

[7]  Jian Xu,et al.  Novel technique for built-in self-test of FPGA interconnects , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

[8]  V.A. Carreno,et al.  A case-study application of RTCA DO-254: design assurance guidance for airborne electronic hardware , 2000, 19th DASC. 19th Digital Avionics Systems Conference. Proceedings (Cat. No.00CH37126).

[9]  Charles E. Stroud,et al.  A new bridging fault model for more accurate fault behavior , 2000, 2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057).

[10]  Yervant Zorian,et al.  IS-FPGA : a new symmetric FPGA architecture with implicit scan , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[11]  Charles E. Stroud A Designer's Guide to Built-In Self-Test , 2002 .

[12]  Mehdi Baradaran Tahoori Using satisfiability in application-dependent testing of FPGA interconnects , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).

[13]  Mehdi Baradaran Tahoori Application-Specific Bridging Fault Testing of FPGAs , 2004, J. Electron. Test..

[14]  Mehdi Baradaran Tahoori,et al.  A multi-configuration strategy for an application dependent testing of FPGAs , 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

[15]  Mehdi Baradaran Tahoori Application-Dependent Testing of FPGAs , 2006, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[16]  Mehdi Baradaran Tahoori,et al.  Application-Dependent Delay Testing of FPGAs , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[17]  María José Moure,et al.  Features, Design Tools, and Application Domains of FPGAs , 2007, IEEE Transactions on Industrial Electronics.

[18]  Carthik A. Sharma,et al.  BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores , 2008, ESA.

[19]  Iain Bate,et al.  Component-Based Safety Analysis of FPGAs , 2010, IEEE Transactions on Industrial Informatics.

[20]  Eric Monmasson,et al.  FPGAs in Industrial Control Applications , 2011, IEEE Transactions on Industrial Informatics.

[21]  Massimo Violante,et al.  Coping With the Obsolescence of Safety- or Mission-Critical Embedded Systems Using FPGAs , 2011, IEEE Transactions on Industrial Electronics.

[22]  Eric Monmasson,et al.  FPGA-Based Dynamic Reconfiguration of Sliding Mode Current Controllers for Synchronous Machines , 2013, IEEE Transactions on Industrial Informatics.

[23]  Eric Monmasson,et al.  Guest Editorial Special Section on Industrial Control Applications of FPGAs , 2013 .

[24]  Francisco J. Rodriguez,et al.  FPGA-Based Implementation of a Predictive Current Controller for Power Converters , 2013, IEEE Transactions on Industrial Informatics.

[25]  Fabrizio Lombardi,et al.  Single-configuration fault detection in applicationdependent testing of field programmable gate array interconnects , 2013, IET Comput. Digit. Tech..

[26]  Luis Gomes,et al.  Guest Editorial Special Section on Embedded and Reconfigurable Systems , 2013 .

[27]  Fabrizio Lombardi,et al.  A Novel Heuristic Method for Application-Dependent Testing of a SRAM-Based FPGA Interconnect , 2013, IEEE Transactions on Computers.

[28]  Javier Del Ser,et al.  Compact and Fast Fault Injection System for Robustness Measurements on SRAM-Based FPGAs , 2014, IEEE Transactions on Industrial Electronics.