QTL mapping of yield components and kernel traits in wheat cultivars TAM 112 and Duster
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Q. Xue | G. Bai | Xuefeng Ma | Shuyu Liu | J. Rudd | A. Ibrahim | D. Hays | Shichen Wang | P. St. Amand | A. Bernardo | Jason A. Baker | Joshua D. Anderson | Smit Dhakal | Wangqi Huang | Mustafa Cerit | Zhen Wang | S. Baker | Y. Rauf | Shuhao Yu | F. Maulana
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