Comparison of tensile and bulge tests for thin-film silicon nitride
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[1] W. Knauss,et al. A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy , 2002 .
[2] W.N. Sharpe. Mechanical properties of MEMS materials , 2001, 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497).
[3] A. Lal,et al. Characterization of micromachined silicon nitride membrane using resonant ultrasound spectroscopy , 2001, 2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.01CH37263).
[4] David T. Read,et al. Tensile properties of free-standing aluminum thin films☆ , 2001 .
[5] Y. Meng,et al. Size effect on the mechanical properties of microfabricated polysilicon thin films , 2001 .
[6] Y. Meng,et al. Specimen size effect on mechanical properties of polysilicon microcantilever beams measured by deflection using a nanoindenter , 2001 .
[7] W. Sharpe,et al. Tensile Tests of Various Thin Films , 2001 .
[8] David T. Read,et al. Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films , 2000 .
[9] Samuel Harvey Moseley,et al. Fracture tests of etched components using a focused ion beam machine , 2000, SPIE MOEMS-MEMS.
[10] Tong-Yi Zhang,et al. Microbridge testing of silicon nitride thin films deposited on silicon wafers , 2000 .
[11] Mitsuhiro Shikida,et al. Tensile testing of SiO2 and Si3N4 films carried out on a silicon chip , 2000 .
[12] S. M. Spearing,et al. Materials issues in microelectromechanical systems (MEMS) , 2000 .
[13] R. L. Edwards,et al. Relating mechanical testing and microstructural features of polysilicon thin films , 1999 .
[14] C. C. Abnet,et al. Wafer Scale Testing of MEMS Structural Films , 1999 .
[15] Oliver Paul,et al. Mechanical properties of thin films from the load deflection of long clamped plates , 1998 .
[16] William N. Sharpe,et al. Round-Robin Tests of Modulus and Strength of Polysilicou , 1998 .
[17] R. L. Edwards,et al. A new technique for measuring the mechanical properties of thin films , 1997 .
[18] L. Buchaillot,et al. Silicon Nitride Thin Films Young's Modulus Determination by an Optical Non Destructive Method , 1997 .
[19] T. Tsuchiya,et al. Specimen size effect on tensile strength of surface micromachined polycrystalline silicon thin films , 1997, Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots.
[20] R. L. Edwards,et al. Measurements of Young's modulus, Poisson's ratio, and tensile strength of polysilicon , 1997, Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots.
[21] D. Schneider,et al. Non-destructive characterization and evaluation of thin films by laser-induced ultrasonic surface waves , 1996 .
[22] David T. Read,et al. A new method for measuring the strength and ductility of thin films , 1993 .
[23] Daniel Josell,et al. A new method for tensile testing of thin films , 1993 .
[24] Joost J. Vlassak,et al. A new bulge test technique for the determination of Young’s modulus and Poisson’s ratio of thin films , 1992 .
[25] G. Cardinale,et al. Fracture strength and biaxial modulus measurement of plasma silicon nitride films , 1992 .
[26] J. A. Taylor. The mechanical properties and microstructure of plasma enhanced chemical vapor deposited silicon nitride thin films , 1991 .
[27] Timothy P. Weihs,et al. Measuring stiffnesses and residual stresses of silicon nitride thin films , 1990 .
[28] R. Muller,et al. Measurement of Young's modulus on microfabricated structures using a surface profiler , 1990, IEEE Proceedings on Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots..
[29] O. Tabata,et al. Mechanical property measurements of thin films using load-deflection of composite rectangular membranes , 1989 .