Distribution fitting approach to application fitness assessment

On top of assessing the specification compliance, it is also important to verify the behavior and performance of the electronic components in the targeted application. This is usually achieved by jointly simulating the component and the application. There is a particular interest in finding the application yield caused by the process variation of the electronic component. The cost of the experiments is usually high, and, if the estimation of the Failure Probability (FP) is done from counts of failure from few simulations, then, the FP is not very accurate. We propose a method of FP estimation based on distribution fitness which represents a more robust statistic. The validation of the method is made on an E-Bike use case and the results show that the proposed approach is more accurate than the one based on counts. The investigation is made by taking into account the role of the operating conditions in the experiments. We achieve this by grouping the test scenarios under a number of mission profiles, on which the developed methods are carried out.