Fundamental investigations of cutting of silicon for photovoltaic applications
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[1] Percy Williams Bridgman,et al. The Effect of Hydrostatic Pressure on the Fracture of Brittle Substances , 1947 .
[2] Industrial Challenges For Thin Wafer Manufacturing , 2006, 2006 IEEE 4th World Conference on Photovoltaic Energy Conference.
[3] Ioannis Chasiotis,et al. Fracture Toughness and Subcritical Crack Growth in Polycrystalline Silicon , 2006 .
[4] Y. Gogotsi,et al. Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study , 2004 .
[5] Bhushan Sopori,et al. Strength of silicon wafers: fracture mechanics approach , 2009 .
[6] Eann A. Patterson,et al. Towards full field automated photoelastic analysis of complex components , 1991 .
[7] Xiang Li,et al. Effect of lubricant on tribo-induced phase transformation of Si , 2006 .
[8] Shreyes N. Melkote,et al. Analysis of stresses and breakage of crystalline silicon wafers during handling and transport , 2009 .
[9] Anthony J. Hayter,et al. Probability and statistics for engineers and scientists , 1996 .
[10] Christophe Ballif,et al. DIAMOND WIRE-SAWN SILICON WAFERS - FROM THE LAB TO THE CELL PRODUCTION , 2009 .
[11] X. Brun. Analysis of handling stresses and breakage of thin crystalline silicon wafers , 2008 .
[12] D. L. Callahan,et al. Origins of microplasticity in low-load scratching of silicon , 1994 .
[13] Eric R. Marsh,et al. THE EFFECT OF CRYSTALLOGRAPHIC ORIENTATION ON DUCTILE MATERIAL REMOVAL IN SILICON , 2022 .
[14] R. Scattergood,et al. Ductile-Regime Grinding: A New Technology for Machining Brittle Materials , 1991 .
[15] Michael V. Swain,et al. Microfracture beneath point indentations in brittle solids , 1975 .
[16] I. Kao,et al. Free Abrasive Machining in Slicing Brittle Materials With Wiresaw , 2001 .
[17] Robert F. Cook,et al. Effect of crystallographic orientation on phase transformations during indentation of silicon , 2009 .
[18] K. Ravi,et al. Electrical effects of SiC inclusions in EFG silicon ribbon solar cells , 1976 .
[19] Michael V. Swain,et al. Microfracture about scratches in brittle solids , 1979, Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences.
[20] D. Hasselman,et al. Evaluation ofKIc of brittle solids by the indentation method with low crack-to-indent ratios , 1982 .
[21] Shreyes N. Melkote,et al. Mechanical Strength of Silicon Wafers Cut by Loose Abrasive Slurry and Fixed Abrasive Diamond Wire Sawing , 2012 .
[22] Shin Takeuchi,et al. Dislocation dynamics and plasticity , 1991 .
[23] T. Kaden,et al. Improving solar grade silicon by controlling extended defect generation and foreign atom defect interactions , 2009 .
[24] Jiwang Yan,et al. Fundamental investigation of subsurface damage in single crystalline silicon caused by diamond machining , 2009 .
[25] M. Swain,et al. Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon , 2000 .
[26] Vishwanath Prasad,et al. Elasto-Hydrodynamic Interaction in the Free Abrasive Wafer Slicing Using a Wiresaw: Modeling and Finite Element Analysis , 2000 .
[27] Masaki Tanaka,et al. Crack tip dislocations in silicon characterized by high-voltage electron microscopy , 2002 .
[28] H. Matzke,et al. On the correlation between solid-particle erosion and fracture parameters in SiC , 1983 .
[29] W. Weibull. A statistical theory of the strength of materials , 1939 .
[30] Y. Mai,et al. Scratch deformation behaviour of alumina under a sharp indenter , 1997 .
[31] K. Niihara,et al. A fracture mechanics analysis of indentation-induced Palmqvist crack in ceramics , 1983 .
[32] M. Swain,et al. Mechanical deformation in silicon by micro-indentation , 2001 .
[33] S. Jahanmir,et al. Microfracture and material removal in scratching of alumina , 1995 .
[34] Imin Kao,et al. Galerkin-based modal analysis on the vibration of wire–slurry system in wafer slicing using a wiresaw , 2005 .
[35] W. Zhang,et al. An elastic–plastic-cracking model for finite element analysis of indentation cracking in brittle materials , 2001 .
[36] T. L. Jester,et al. Crystalline silicon manufacturing progress , 2002 .
[37] A. Evans,et al. Elastic/Plastic Indentation Damage in Ceramics: The Median/Radial Crack System , 1980 .
[38] N. Chen,et al. On-wafer investigation of SiC and Si3N4 inclusions in multicrystalline Si grown by directional solidification , 2008 .
[39] J. E. Smith,et al. Raman Spectra of Amorphous Si and Related Tetrahedrally Bonded Semiconductors , 1971 .
[40] T. Childs,et al. Fundamentals of friction and wear of materials , 1983 .
[41] G. Rozgonyi,et al. Nano-indentation: A tool to investigate crack propagation related phase transitions in PV silicon , 2012 .
[42] Y. Gogotsi,et al. Effect of indentation unloading conditions on phase transformation induced events in silicon , 2003 .
[43] Hans Joachim Möller,et al. Wafering of silicon crystals , 2006 .
[44] S. Wiederhorn,et al. Effect of material parameters on the erosion resistance of brittle materials , 1983 .
[45] Tsunemoto Kuriyagawa,et al. Ductile regime turning at large tool feed , 2002 .
[46] Sabri Cetinkunt,et al. Raman microspectroscopy analysis of pressure-induced metallization in scratching of silicon , 2001 .
[47] Norman A. Fleck,et al. Brittle fracture under a sliding line contact , 1994 .
[48] O. Breitenstein,et al. Electronic activity of SiC precipitates in multicrystalline solar silicon , 2007 .
[49] P. Hirsch,et al. THE BRITTLE-DUCTILE TRANSITION IN SILICON , 1991 .
[50] Joerg Bagdahn,et al. Fracture toughness and fatigue investigations of polycrystalline silicon , 2001, SPIE MOEMS-MEMS.
[51] T. Belytschko,et al. Analysis of three‐dimensional crack initiation and propagation using the extended finite element method , 2005 .
[52] F. Ebrahimi,et al. Fracture anisotropy in silicon single crystal , 1999 .
[53] Masahiko Yoshino,et al. Some experiments on the scratching of silicon:: In situ scratching inside an SEM and scratching under high external hydrostatic pressures , 2001 .
[54] Martin Kittler,et al. Influence of dislocation density on recombination at grain boundaries in multicrystalline silicon , 1993 .
[55] Crain,et al. Reversible pressure-induced structural transitions between metastable phases of silicon. , 1994, Physical review. B, Condensed matter.
[56] Enhancing the mechanical properties of single-crystal CVD diamond. , 2009, Journal of physics. Condensed matter : an Institute of Physics journal.
[57] G. Dent,et al. Modern Raman Spectroscopy: A Practical Approach , 2005 .
[58] B. Lawn. Partial cone crack formation in a brittle material loaded with a sliding spherical indenter , 1967, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.
[59] A. Soiland,et al. SiC and Si3N4 inclusions in multicrystalline silicon ingots , 2004 .
[60] K. Kurihara,et al. CROSS-SECTION TRANSMISSION ELECTRON MICROSCOPE OBSERVATIONS OF DIAMOND-TURNED SINGLE-CRYSTAL SI SURFACES , 1994 .
[61] Jianjun Shi,et al. PDE-Constrained Gaussian Process Model on Material Removal Rate of Wire Saw Slicing Process , 2011 .
[62] A. Evans,et al. Elastic/Plastic Indentation Damage in Ceramics: The Lateral Crack System , 1982 .
[63] K. H. Yang,et al. An Etch for Delineation of Defects in Silicon , 1984 .
[64] K. Sumino. Dislocations and mechanical properties of silicon , 1989 .
[65] M. Buijs,et al. A model for lapping of glass , 1993, Journal of Materials Science.
[66] D. W. Saunders,et al. The Anisotropy of Young's Modulus in Drawn Polyethylene , 1961 .
[67] Hsu Tai-Ran. MEMS & microsystems: design and manufacture / Tai-Ran Hsu , 2002 .
[68] N. Chen,et al. Wire-sawing defects on multicrystalline silicon wafers grown by a directional solidification method , 2008 .
[69] Hans Joachim Möller,et al. Multicrystalline silicon for solar cells , 2005 .
[70] Y. Katoh,et al. Handbook of SiC properties for fuel performance modeling , 2007 .
[71] Shirley Dex,et al. JR 旅客販売総合システム(マルス)における運用及び管理について , 1991 .
[72] P. Hess,et al. Comparison of mode-resolved fracture strength of silicon with mixed-mode failure of diamond crystals , 2010 .
[73] Spain,et al. Crystal data for high-pressure phases of silicon. , 1986, Physical review. B, Condensed matter.
[74] Robert Hull,et al. Properties of Crystalline Silicon , 1999 .
[75] N. P. Hung,et al. Effect of Crystalline Orientation in the Ductile-Regime Machining of Silicon , 2000 .
[76] Y. Kondo,et al. Characterization of polycrystalline silicon wafers for solar cells sliced with novel fixed‐abrasive wire , 2010 .
[77] S. Danyluk. Influence of fluids on the abrasion of silicon by diamond , 1982 .
[78] K. Syassen,et al. Crystal Structure of the High-Pressure Phase Silicon VI , 1999 .
[79] S. Tolbert,et al. Pressure-induced structural transformations in Si nanocrystals: Surface and shape effects. , 1996, Physical review letters.
[80] Santo Martinuzzi,et al. Influence of dislocations on electrical properties of large grained polycrystalline silicon cells. I. Model , 1989 .
[81] J. Wortman,et al. Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and Germanium , 1965 .
[82] Ruoff,et al. Experimental study of the crystal stability and equation of state of Si to 248 GPa. , 1990, Physical review. B, Condensed matter.
[83] Alberto Carpinteri,et al. Fractal nature of material microstructure and size effects on apparent mechanical properties , 1994 .
[84] C. P. Chen,et al. Fracture toughness of silicon , 1980 .
[85] Shreyes N. Melkote,et al. Study of Ductile-to-Brittle Transition in Single Grit Diamond Scribing of Silicon: Application to Wire Sawing of Silicon Wafers , 2012 .
[86] Tien-Yu Tom Lee,et al. An overview of experimental methodologies and their applications for die strength measurement , 2003 .
[87] W. G. Bowman,et al. Young's modulus , 2014 .
[88] Koji Sumino,et al. Mechanical strength of silicon crystals as a function of the oxygen concentration , 1984 .
[89] S. Danyluk,et al. Surface Free Energy Model of Silicon Anisotropic Etching , 1993 .
[90] O. Breitenstein,et al. A TEM study of SiC particles and filaments precipitated in multicrystalline Si for solar cells , 2008 .
[91] S. Liang,et al. The mechanism of ductile chip formation in cutting of brittle materials , 2007 .
[92] Robert F. Cook,et al. Strength and sharp contact fracture of silicon , 2006 .
[93] T. R. Hsu,et al. MEMS and Microsystems: Design and Manufacture , 2001 .
[94] P. Haasen,et al. Dislocations and Plastic Flow in the Diamond Structure , 1969 .
[95] Meinhard Kuna,et al. A macroscopic mechanical model of the wire sawing process , 2011 .
[96] K. Ma,et al. Ductile behaviour in single-point diamond-turning of single-crystal silicon , 2002 .
[97] Imin Kao,et al. A finite element analysis of temperature variation in silicon wafers during wiresaw slicing , 2008 .
[98] C. Tromas,et al. Study of the mechanical properties of ceramic materials by the nanoindentation technique , 1998 .
[99] F. Shimura. Semiconductor Silicon Crystal Technology , 1989 .
[100] S. Danyluk,et al. The influence of backgrinding on the fracture strength of 100 mm diameter (1 1 1) p-type silicon wafers , 1997 .
[101] J. Zou,et al. Microstructures of phases in indented silicon: A high resolution characterization , 2003 .
[102] J. Wang,et al. Critical Depth of Cut and Specific Cutting Energy of a Microscribing Process for Hard and Brittle Materials , 2008 .
[103] Fengzhou Fang,et al. Modelling and experimental investigation on nanometric cutting of monocrystalline silicon , 2005 .
[104] F. Yang,et al. Interior Stress for Axisymmetric Abrasive Indentation in the Free Abrasive Machining Process: Slicing Silicon Wafers With Modern Wiresaw , 1999 .
[105] J. Li,et al. Modeling Stresses of Contacts in Wire Saw Slicing of Polycrystalline and Crystalline Ingots: Application to Silicon Wafer Production , 1998 .
[106] Y. B. Xu,et al. Direct evidence for microplastic fracture in single-crystal silicon at ambient temperature , 1998 .
[107] Markus Apel,et al. Simulation of mechanical stress during bending tests for crystalline wafers , 2003, 3rd World Conference onPhotovoltaic Energy Conversion, 2003. Proceedings of.
[108] R. H. Myers,et al. Probability and Statistics for Engineers and Scientists , 1978 .
[109] Hans Joachim Möller,et al. Basic Mechanisms and Models of Multi‐Wire Sawing , 2004 .
[110] Lang Zhou,et al. Hard inclusions and their detrimental effects on the wire sawing process of multicrystalline silicon , 2007 .
[111] Shreyes N. Melkote,et al. Effect of crystallographic orientation on ductile scribing of crystalline silicon: Role of phase transformation and slip , 2012 .
[112] Ted Belytschko,et al. A finite element method for crack growth without remeshing , 1999 .
[113] Takao Abe,et al. Effects of nitrogen on dislocation behavior and mechanical strength in silicon crystals , 1983 .
[114] Meinhard Kuna,et al. Biaxial Fracture Test of Silicon Wafers , 2004 .
[115] Michael J. Lance,et al. Indentation-induced phase transformations in silicon: influences of load, rate and indenter angle on the transformation behavior , 2005 .
[116] C. del Cañizo,et al. Crystalline silicon solar module technology: Towards the 1 € per watt‐peak goal , 2009 .
[117] Spandan Maiti,et al. A New Analytical Model for Estimation of Scratch‐Induced Damage in Brittle Solids , 2007 .
[118] J. Martínez-Fernández,et al. Microstructure and room-temperature mechanical properties of Si3N4 with various α/β phase ratios , 1998 .
[119] Allan,et al. Pressure dependence of the Imma phase of silicon. , 1994, Physical review. B, Condensed matter.
[120] M. A. Moore,et al. Abrasive wear of brittle solids , 1980 .
[121] K. Nickel,et al. Phase transformations of silicon caused by contact loading , 1997 .
[122] M. Rahman,et al. The upper bound of tool edge radius for nanoscale ductile mode cutting of silicon wafer , 2006 .
[123] M. B. Cai,et al. Study of the mechanism of nanoscale ductile mode cutting of silicon using molecular dynamics simulation , 2007 .
[124] W. Zhang,et al. Finite element analysis of brittle cracking due to single grit rotating scratch , 2003 .
[125] A. Hartmaier,et al. Analyzing crack-tip dislocations and their shielding effect on fracture toughness , 2008 .
[126] Steven Danyluk,et al. Analysis and determination of the stress-optic coefficients of thin single crystal silicon samples , 2004 .